Renesas H8S/2628 Technical Information Seite 428

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16) Test PERFM G/A
A) Time Measurement .................................OK
B) RESERVED
C) Subroutine Count Measurement .....................OK
D) Timeout Function (TIMOT Bit) .....................OK
E) Timeout Function (TIMOP Bit) .....................OK
Shows the check results
for analysis controlling
circuits in the E6000
(normal completion).
17) Test Bus Monitor
A) Register .........................................OK
B) Parallel RAM .....................................OK
C) SPRSEL2 ..........................................OK
D) RAM Monitor ......................................OK
Shows the check results
for the bus monitor
controlling circuits in
the E6000 (normal
completion).
18) Test Parallel Access
A) Internal ROM Parallel Read Access(WORD) ..........OK
B) Internal ROM Parallel Write Access(WORD) .........OK
C) Internal ROM Parallel Write Access(High Byte) ....OK
D) Internal ROM Parallel Write Access(Low Byte) .....OK
E) Internal RAM Parallel Read Access(WORD) ..........OK
F) Internal RAM Parallel Write Access(WORD) .........OK
G) Internal RAM Parallel Write Access(High Byte) ....OK
H) Internal RAM Parallel Write Access(Low Byte) .....OK
I) Option RAM Parallel Read Access(WORD) ..........SKIP
J) Option RAM Parallel Write Access(WORD) .........SKIP
K) Option RAM Parallel Write Access(High Byte) ....SKIP
L) Option RAM Parallel Write Access(Low Byte) .....SKIP
Shows the check results
for the parallel access
controlling circuits in
the E6000 (normal
completion).
19) Test H8S/2628 Register Read/Write
A) Register Read ....................................OK
B) Register Read/Write Test .........................OK
Shows the check results
for the I/O-register
access.
Tests run for 0h:3min:11s
Shows the check time.
Tests passed, emulator functioning correctly
Shows that the E6000 is
correctly operating.
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